Quality & Reliability
1 reliable and high-quality products and services are the basic principles of ISC mission and value.
2 Our quality commitment is mainly reflected in our objectives of improving customer satisfaction, providing excellent products and improving employee participation, and is supported by the management and all employees.
3 Our quality system ensures that we can meet or exceed the needs and expectations of our customers. These systems are defined in ISC's quality manual and implemented in the process of designing and manufacturing products and supporting customers. ISC's quality system is not static. The improvement and innovation of our processes, systems and products is an important part of our mission.
4. We test, monitor and evaluate the AC parameters and design parameters of each batch of products. These items include: characteristic frequency ft, switching parameters, secondary breakdown, safe working area SOA and junction capacitance cob. We test the thermal resistance rth of products one by one.
Quality assurance
1 ISC always puts quality in the first place and takes it as the top priority of management at all levels. Each employee has well-trained skills and attaches great importance to quality.
2. All our production processes actively improve the quality. Each employee of ISC is an inspector to check the products. Each employee should be responsible for the quality and maintain a high degree of consistency of quality.
3 after receiving each order from customers, our quality team will organize contract review, carefully evaluate and plan to ensure product quality and timely delivery, and then arrange production.
4 Every order, model and sample has been tested, including aging and reliability test, and the test record data of each batch sent to customers will be kept in our computer system for a long time, which can be consulted, compared and evaluated at any time.
5 All our products can leave the factory only after final inspection. If customers need, we can provide final inspection report with the goods.
6 We provide product instructions and test reports for each sample.
7 The quality guarantee period of our products is long-term, and we can work stably and reliably in circuits and electronic equipment for at least ten years.
Reliability
Solid state semiconductor carries out a series of reliability tests on devices, and the test devices cover all our product series.
Test items and requirements:
Test items | Reference standard | Condition | Time | Sample | Frequency |
Thermal measurement | / | Plastic encapsulated device£º125¡æ | / | 100% | Each batch |
Metal packaging device£º150¡æ | |||||
Transient thermal resistance | / | Rth=¡÷VBE/2*Pc | / | 100% | Each batch |
High temperature storage HTST | GB/T2423.2 | Ta=150¡æ | 24h/168h/1000h | 50 | According to variety |
Electrical durability | GB/T 4587 | Add several watts of power to the device to keep the shell temperature at 75 ¡æ ~ 120 ¡æ | 24h/168h/1000h | 30 | New variety, change or need |
Temperature cycle TCT | GB/T2423.22 | -55¡æ~+150¡æ | 30min cycle 5 ~ 10 times | 30 | New variety, change or need |
Steady state damp heat | GB/T2423.3 | Ta=85¡æ, 85%RH | 168h | 30 | New variety, change or need |
Weldability | GB/T2423.28 | After accelerated aging of the device in steam, the solder wetting area shall be evaluated | 1h | 38 | regular |
High temperature reverse bias HTRB | GB/T4587 | According to device type£¬125¡æ£¬0.8*Vce/Vdss | 168h | 30 | New variety, change or need |
Gap working life | G-003 | Add several watts of power to the device to make the shell temperature 85 ¡æ ~ 120 ¡æ, power on for 1min and turn off for 2-3min | 1000´Î/5000´Î | 30 | New variety, change or need |
Humidity sensitivity grade MSL | JEDEC J-STD-020 | Bake at 125 ¡æ for 24h, and complete reflow welding for 3 times within 15min ~ 4h after taking out | 3 reflow soldering | 77 | TO-252 / 263 patch products |
Pressure cooker test PCT | JESD22-A102 | 205KPa£¬100%RH£¬121¡À2¡æ | 96h | 30 | New mould and new plastic sealing material |
Low temperature storage LTST | GB/T2423.1 | -40¡æ»ò-55¡æ£¬ | 24h/168h/1000h | 50 | According to variety |
High acceleration stressHAST | JESD22-A110 /A118 | 130¡æ£¬85%RH | 96h | 30 | Plastic encapsulated device |
Electrostatic discharge damage (ESD) | MIL-STD-883 | HBD model | / | 5-10 | MOSFET device |
Electrical test | GB/T4589.1 GB/T4587 | According to variety | / | 100% | Discrete device |
X-ray equipment Microscope
Ultrasonic scanning equipment TO-3 automatic loading machine
Electric aging equipment High temperature aging furnace
High and low temperature test chamber High temperature reverse bias equipment
High temperature test system High temperature and humidity test equipment
FT tester Switchgear parameter tester
Cob tester Thickness gauge
Secondary breakdown tester Diode forward voltage drop tester
Thermal resistance tester Thermal aging
Thermal test bench life-test rack
Address: 68 Xinmei Road, WND, Wuxi, Jiangsu, China (214028)
Tel: 0510-85346350 Email: mdh@iscsemi.com mdd@iscsemi.com
Links: ChipFind ALLDatasheet IC2China